Scientific instrument development needs to achieve cooperation and win-win

The R&D of the instrument is to make it work and achieve new breakthroughs in certain fields. In a large family with complex institutions and multiple research directions in the Chinese Academy of Sciences, how can we build bridges between the development and use of scientific research instruments to complement each other's advantages, achieve win-win cooperation, and avoid unnecessary waste of funds? In this regard, the "High-speed Scanning Atomic Force Microscopy" project of the Institute of Electrical Engineering of the Chinese Academy of Sciences and the National Center for Nanoscience may be regarded as a model. On June 28th, the reporter of the “Journal of China Science” visited the related laboratory of the Institute of Electrical Engineering of the Chinese Academy of Sciences and the National Nanoscience Center.

"Simply speaking, our instrument R&D project is to develop a high-speed AFM to meet the research needs of the nanocenter, and help them to realize the observation of dynamic characteristics of cells. The Institute of Electrical Engineering has developed expertise in the development of high-precision instruments." Han Li, director of the director’s assistant and director of the micro-nano processing technology research department, enthusiastically introduced the situation to the reporter. “This is also a snap.”

Behind Han Li, there are various kinds of information piled up in mountains, and the small office is a bit messy. "The work is too busy. I haven't had time to sort it out. I'll be going to Bulgaria in a few days." Han quickly explained the reporter's look.

Since its birth in 1986, the AFM has become one of the most representative tools in the field of nanotechnology because of its capability of nanometer measurement, manipulation and processing. The high-speed scanning atomic force microscope (HS-AFM system) can not only reduce the scanning time, but also make up for the lack of real-time observation of the dynamic changes of biological samples by common scanners.

“The microscope independently developed by the Institute of Electrical Engineering is fast and has a wide range of observations. Its scanning frequency is up to 70 Hz and the scanning range is up to 50-70 μm.” The characteristics of this instrument were mentioned, and Han Li continued, “I say so. Well, no other country has such an instrument, the speed of scanning is not as large as our observation range, and the scanning range is barely faster than us.Now, it has been successfully applied to the in-situ imaging of living microvascular endothelial cells. ”

Ordinary cells have a diameter between 40 μm and 50 μm, but the previous high-speed AFM could scan only 2 to 3 μm at a time, and the range is too small to help observe the mechanical characteristics of the cells. The microscope can make a complete observation of the entire cell, which is of great significance.

At 2:30 pm on the same day, under the leadership of Han Dong, a researcher at the National Center for Nanoscience, reporters and Han Li and colleagues visited the Nanobiomedical Imaging and Characterization Laboratory at the National Nanoscience Center. A series of colored cell images hung on the wall at the entrance to the laboratory. "These are scanned using the atomic force microscope," Han Dong said.

At the center of the laboratory, the only domestic "high-speed scanning atomic force microscope and rapid confocal fluorescence microscope combined imaging system" is currently prominent. The system consists of four parts, the main computer is responsible for microscope control and scanning image processing; HS-AFM main controller is the brain of the entire system, there are special electronic systems; HS-AFM scan head is responsible for scanning and imaging of cell samples Rapid confocal fluorescence microscopy is primarily responsible for the primary selection of the scanning position of the cell sample.

Han Dong said that this instrument was initially developed in the field of medicine. “General microscopes can only observe the biochemical and external characteristics of cells. Our instruments can sense the force changes between cells and reveal their mechanical characteristics. High-speed scanning AFM will make a big difference in the field of medical detection.”

For example, Han Dong said that most hospitals use cervical microscopy to determine whether there are cancer cells when they examine patients with cervical cancer. However, once they are found to be basically in the late stages, the patient's condition is no help. Atomic force microscopy is not the case. It can sense abnormal cells in the early stage of cancer, and it can be discovered in advance whether the patient has cancer and is convenient for early treatment.

"Poisely estimate that all hospitals in the future may use our high-speed scanning atomic force microscope to detect patient characteristics." Han Dong said, "Of course, it will take time to achieve this goal."

"High-speed scanning AFM is a good example of our scientific instrumentation. By using and manufacturing in a fully cooperative manner, we can develop faster and more accurate scanning probe microscopes, which will play a greater role in microelectronic detection. We will conduct more in-depth discussions on this type of scientific cooperation.” Han said that he will continue to work hard in the field of atomic force microscopy to make greater achievements.